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Abstract by Jacob Denning

Personal Infomation


Presenter's Name

Jacob Denning

Degree Level

Undergraduate

Abstract Infomation


Department

Chemistry and Biochemistry

Faculty Advisor

Matthew Linford

Title

Trends in Advanced X-ray Photoelectron Spectroscopy (XPS) Instrumentation

Abstract

Trends in Advanced X-ray Photoelectron Spectroscopy (XPS) Instrumentation

Jacob C. Denning, Matthew R. Linford

Abstract

Since its inception, XPS has undergone a series of changes to both its instrumentation and software that have enabled it to become a higher quality analytical tool. These improvements have increased the scientific community’s ability to understand thin films and coatings. Traditional angle resolved XPS (AR-XPS) fixes in a sequential fashion the angles between the surface and the entrance of an X-ray spectrometer. Newer features of ThermoFisher’s Theta Probe instrument discussed in this presentation, redefine the limitations of AR-XPS. Indeed, AR-XPS spectra can be obtained with this spectrometer without changing the orientation of the specimen. This unique feature allows direct determination of depth profiles of multi-layered samples. This feature, among others, opens the door for greater understanding of sample materials that will lead to increased scientific knowledge of thin films and materials.